Urban, Frank

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Urban, Frank Graduate Faculty

Positions

Associate Professor, Electrical and Computer Engineering , College of Engineering and Computing

urban@fiu.edu

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selected scholarly works & creative activities

Article
- 2024
  
  Numerical ellipsometry: AI for real-time, in situ process control for absorbing films growing on unknown transparent substrates. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 42.
  Full Text via DOI: 10.1116/6.0003817 Web of Science: 001283150000004
- 2024
  
  Numerical ellipsometry: Artificial intelligence for rapid analysis of indium tin oxide films on silicon. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 42.
  Full Text via DOI: 10.1116/6.0003548 Web of Science: 001214471100001
- 2024
  
  Numerical ellipsometry: Artificial intelligence for real-time, in situ absorbing film process control. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 42.
  Full Text via DOI: 10.1116/6.0003196 Web of Science: 001143691100001
- 2023
  
  Exploring the Dielectric Properties of Lanthanide Oxide Thin Films
  Full Text via DOI: 10.1149/ma2023-02321582mtgabs
- 2023
  
  Numerical ellipsometry: A method for selecting a single β-gallium oxide monoclinic crystal orientation able to determine the complete permittivity tensor. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 41.
  Full Text via DOI: 10.1116/6.0002235 Web of Science: 000898617500001
- 2022
  
  Four-Compartment Diffusion Model of Cortisol Disposition: Comparison With 3 Alternative Models in Current Clinical Use
  Full Text via DOI: 10.1210/jendso/bvac173 Web of Science: 000903088100002
- 2021
  
  Numerical ellipsometry: A method for selecting a near-minimal infrared measurement set for β-gallium oxide. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 39.
  Full Text via DOI: 10.1116/6.0001002 Web of Science: 000672155600001
- 2021
  
  Decreased maximal cortisol secretion rate in patients with cirrhosis: Relation to disease severity
  Full Text via DOI: 10.1016/j.jhepr.2021.100277 Web of Science: 000658290100016
- 2021
  
  Muscle fatigue modelling: Solving for fatigue and recovery parameter values using fewer maximum effort assessments. INTERNATIONAL JOURNAL OF INDUSTRIAL ERGONOMICS. 82.
  Full Text via DOI: 10.1016/j.ergon.2021.103104 Web of Science: 000633216000003
- 2020
  
  SAT-738 Sources of Error in Estimation of Cortisol Half-Life Using Conventional, Single-Compartment Model: Bias Due to Variation in CBG Concentration
  Full Text via DOI: 10.1210/jendso/bvaa046.912
- 2020
  
  Numerical ellipsometry: Methods for selecting measurements and techniques for advanced analysis applied to β-gallium oxide. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 38.
  Full Text via DOI: 10.1116/1.5134790 Web of Science: 000514654700002
- 2019
  
  SAT-376 Dynamic Modeling of the 1 mg Overnight Dexamethasone Suppression Test: Sources of Variability and Strategies to Improve Diagnostic Accuracy for Detection of Autonomous Cortisol Secretion in Adrenal Adenoma Patients
  Full Text via DOI: 10.1210/js.2019-sat-376
- 2019
  
  Optimisation-based identification of parameters in a mathematical model of muscle fatigue
  Full Text via DOI: 10.1504/ijhfms.2019.102171
- 2018
  
  Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic films. THIN SOLID FILMS. 663:116-125.
  Full Text via DOI: 10.1016/j.tsf.2018.07.047 Web of Science: 000443012200018
- 2017
  
  Comparison of three methods for ellipsometry characterization of thin absorbing films. THIN SOLID FILMS. 644:182-189.
  Full Text via DOI: 10.1016/j.tsf.2017.06.060 Web of Science: 000416041400026
- 2017
  
  Reactive sputter deposition and annealing of nanometer scale NiO thin films for metal-insulator-metal tunnel junction diodes. THIN SOLID FILMS. 644:23-28.
  Full Text via DOI: 10.1016/j.tsf.2017.06.063 Web of Science: 000416041400005
- 2017
  
  Characterization of Cortisol Secretion Rate in Secondary Adrenal Insufficiency
  Full Text via DOI: 10.1210/js.2017-00198 Web of Science: 000425348400017
- 2015
  
  Numerical ellipsometry: Examination of growing nickel and rhenium thin films using n-k plane analysis and effective numerical substrates. THIN SOLID FILMS. 583:239-244.
  Full Text via DOI: 10.1016/j.tsf.2015.03.062 Web of Science: 000353812400037
- 2015
  
  Reversible Increase in Maximal Cortisol Secretion Rate in Septic Shock. CRITICAL CARE MEDICINE. 43:549-556.
  Full Text via DOI: 10.1097/CCM.0000000000000721 Web of Science: 000349963600019
- 2014
  
  Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane. THIN SOLID FILMS. 562:49-55.
  Full Text via DOI: 10.1016/j.tsf.2014.03.067 Web of Science: 000340658100007
- 2013
  
  Multiband Optical Absorption Controlled by Lattice Strain in Thin-Film LaCrO₃. PHYSICAL REVIEW LETTERS. 110.
  Full Text via DOI: 10.1103/PhysRevLett.110.077401 Web of Science: 000314869200017
- 2012
  
  Estimation of Maximal Cortisol Secretion Rate in Healthy Humans. JOURNAL OF CLINICAL ENDOCRINOLOGY & METABOLISM. 97:1285-1293.
  Full Text via DOI: 10.1210/jc.2011-2227 Web of Science: 000302787800058
- 2011
  
  Numerical ellipsometry: Advanced analysis of thin absorbing films in the n-k plane. THIN SOLID FILMS. 519:6284-6289.
  Full Text via DOI: 10.1016/j.tsf.2011.03.133 Web of Science: 000292720000015
- 2011
  
  Numerical ellipsometry: n-k plane analysis of transparent conducting films. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 29.
  Full Text via DOI: 10.1116/1.3589803 Web of Science: 000292639500016
- 2009
  
  Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles. THIN SOLID FILMS. 518:1411-1414.
  Full Text via DOI: 10.1016/j.tsf.2009.09.071 Web of Science: 000272861500013
- 2009
  
  Validation of a simple method of estimating plasma free cortisol: Role of cortisol binding to albumin. CLINICAL BIOCHEMISTRY. 42:64-71.
  Full Text via DOI: 10.1016/j.clinbiochem.2008.09.115 Web of Science: 000262456200012
- 2008
  
  Numerical Ellipsometry: Ellipsometer analysis in the n-k plane for growing films on unknown homogeneous, isotropic substrates and unknown, layered substrates. THIN SOLID FILMS. 517:1081-1085.
  Full Text via DOI: 10.1016/j.tsf.2008.04.101 Web of Science: 000262053800015
- 2008
  
  Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators. THIN SOLID FILMS. 517:1063-1071.
  Full Text via DOI: 10.1016/j.tsf.2008.05.041 Web of Science: 000262053800012
- 2007
  
  Ellipsometer analysis in the n-k plane. THIN SOLID FILMS. 516:119-127.
  Full Text via DOI: 10.1016/j.tsf.2007.06.080 Web of Science: 000252037500004
- 2007
  
  NUMERICAL SOLUTION FOR CORTISOL EQUILIBRIUM AND MAXIMAL CORTISOL SECRETION RATES IN HUMAN SEPTIC SHOCK AND HEALTHY CONTROL SUBJECTS.: 59. JOURNAL OF INVESTIGATIVE MEDICINE. 55:s85.
  Full Text via DOI: 10.1097/00042871-200701010-00067
- 2006
  
  Ellipsometer measurements using focused and masked beams. THIN SOLID FILMS. 515:911-916.
  Full Text via DOI: 10.1016/j.tsf.2006.07.060 Web of Science: 000242639600014
- 2005
  
  Partially ionized beam deposition of parylene. JOURNAL OF NON-CRYSTALLINE SOLIDS. 351:3536-3541.
  Full Text via DOI: 10.1016/j.jnoncrysol.2005.08.027 Web of Science: 000233151200019
- 2002
  
  Optical properties of nanophase films measured by variable-angle spectroscopic ellipsometry. THIN SOLID FILMS. 408:211-217.
  Full Text via DOI: 10.1016/S0040-6090(02)00082-2 Web of Science: 000175889200032
- 2001
  
  Irreversible magnetization in nickel nanoparticles. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS. 225:337-345.
  Full Text via DOI: 10.1016/S0304-8853(00)01379-2 Web of Science: 000168329200004
- 1999
  
  Interesting optical properties of films composed of very small grains formed from a high-rate nanoparticle beam. THIN SOLID FILMS. 355:513-517.
  Full Text via DOI: 10.1016/S0257-8972(99)00373-4 Web of Science: 000084500800089
- 1998
  
  Extremely fast ellipsometry solutions using cascaded neural networks alone. THIN SOLID FILMS. 332:50-55.
  Full Text via DOI: 10.1016/S0040-6090(98)01201-2 Web of Science: 000077202500011
- 1998
  
  Toward a priori selection of ellipsometry angles and wavelengths using a high performance semantic database. THIN SOLID FILMS. 313:119-123.
  Full Text via DOI: 10.1016/S0040-6090(97)00783-9 Web of Science: 000073761700020
- 1997
  
  Sensitivity of variable angle spectroscopic ellipsometry to isotropic thin film properties. THIN SOLID FILMS. 308:31-37.
  Full Text via DOI: 10.1016/S0040-6090(97)00670-6 Web of Science: 000071553400007
- 1997
  
  Deconvolution of tip affected atomic force microscope images and comparison to Rutherford backscattering spectrometry
  Full Text via DOI: 10.1116/1.589412 Web of Science: A1997XT08800006
- 1996
  
  An algorithm for analyzing ellipsometric data taken with multiple angles of incidence. THIN SOLID FILMS. 290:51-56.
  Full Text via DOI: 10.1016/S0040-6090(96)09186-9 Web of Science: A1996WB81900012
- 1996
  
  Comparison of atomic force microscope and Rutherford backscattering spectrometry data of nanometre size zinc islands. THIN SOLID FILMS. 290:312-316.
  Full Text via DOI: 10.1016/S0040-6090(96)08968-7 Web of Science: A1996WB81900061
- 1996
  
  Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry
  Web of Science: A1996VZ36100005
- 1996
  
  Numerical ellipsometry: Applications of a new algorithm for real-time, in situ film growth monitoring. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 14:2331-2336.
  Full Text via DOI: 10.1116/1.580018 Web of Science: A1996VA96400052
- 1996
  
  Numerical ellipsometry: Real-time solutions using mapping onto the complex index plane. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 14:786-790.
  Full Text via DOI: 10.1116/1.580390 Web of Science: A1996UR13400023
- 1995
  
  Numerical techniques useful in the practice of ellipsometry. THIN SOLID FILMS. 270:78-84.
  Full Text via DOI: 10.1016/0040-6090(95)06849-X Web of Science: A1995TM18700017
- 1995
  
  Recent developments in ionized cluster beam thin film deposition. THIN SOLID FILMS. 270:637-642.
  Full Text via DOI: 10.1016/0040-6090(95)06845-7 Web of Science: A1995TM18700119
- 1995
  
  Surface analysis algorithms for scanning probe microscopy. THIN SOLID FILMS. 270:399-405.
  Full Text via DOI: 10.1016/0040-6090(95)06708-6 Web of Science: A1995TM18700075
- 1995
  
  INVESTIGATION OF SILVER IN THE IONIZED CLUSTER BEAM DEPOSITION TECHNIQUE. JOURNAL OF PHYSICS D-APPLIED PHYSICS. 28:2365-2370.
  Full Text via DOI: 10.1088/0022-3727/28/11/022 Web of Science: A1995TF19200022
- 1994
  
  ADVANCED IMAGE-PROCESSING IN SCANNING PROBE MICROSCOPY. THIN SOLID FILMS. 253:318-325.
  Full Text via DOI: 10.1016/0040-6090(94)90341-7 Web of Science: A1994PX35600058
- 1994
  
  GOLD AND ZINC THIN-FILMS DEPOSITED BY THE IONIZED CLUSTER BEAM TECHNIQUE. THIN SOLID FILMS. 253:402-406.
  Full Text via DOI: 10.1016/0040-6090(94)90356-5 Web of Science: A1994PX35600073
- 1994
  
  MODELING OF SURFACE-ROUGHNESS IN VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY, USING NUMERICAL PROCESSING OF ATOMIC-FORCE MICROSCOPY IMAGES. THIN SOLID FILMS. 253:326-332.
  Full Text via DOI: 10.1016/0040-6090(94)90342-5 Web of Science: A1994PX35600059
- 1994
  
  NUMERICAL ELLIPSOMETRY - ENHANCEMENT OF NEW ALGORITHMS FOR REAL-TIME, IN-SITU FILM GROWTH MONITORING. THIN SOLID FILMS. 253:262-268.
  Full Text via DOI: 10.1016/0040-6090(94)90332-8 Web of Science: A1994PX35600049
- 1994
  
  REAL-TIME, IN-SITU ELLIPSOMETRY SOLUTIONS USING ARTIFICIAL NEURAL-NETWORK PREPROCESSING. THIN SOLID FILMS. 245:167-173.
  Full Text via DOI: 10.1016/0040-6090(94)90894-X Web of Science: A1994NP81400028
- 1993
  
  DETERMINATION OF ZINC CLUSTER-SIZE IN IONIZED CLUSTER BEAM FILM DEPOSITION. JOURNAL OF APPLIED PHYSICS. 74:1335-1338.
  Full Text via DOI: 10.1063/1.354888 Web of Science: A1993LM78200089
- 1993
  
  SELECTIVE-AREA DEPOSITION OF METAL-FILMS BY THE IONIZED CLUSTER BEAM METHOD. APPLIED PHYSICS LETTERS. 62:3117-3119.
  Full Text via DOI: 10.1063/1.109155 Web of Science: A1993LF99000019
- 1993
  
  ELLIPSOMETRY ALGORITHM FOR ABSORBING FILMS. APPLIED OPTICS. 32:2339-2344.
  Full Text via DOI: 10.1364/AO.32.002339 Web of Science: A1993KZ60800025
- 1992
  
  DEVELOPMENT OF ARTIFICIAL NEURAL NETWORKS FOR REAL-TIME, INSITU ELLIPSOMETRY DATA REDUCTION. THIN SOLID FILMS. 220:247-253.
  Full Text via DOI: 10.1016/0040-6090(92)90580-5 Web of Science: A1992KA73500042
- 1992
  
  FORMATION OF ZINC CLUSTERS IN IONIZED CLUSTER BEAM FILM DEPOSITION. APPLIED PHYSICS LETTERS. 61:1180-1181.
  Full Text via DOI: 10.1063/1.107639 Web of Science: A1992JM34100013
- 1991
  
  STUDY OF THE IONIZED CLUSTER BEAM TECHNIQUE. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 9:537-541.
  Full Text via DOI: 10.1116/1.577404 Web of Science: A1991FR76100032
- 1990
  
  FORMATION OF GOLD CLUSTERS IN THE IONIZED CLUSTER BEAM DEPOSITION TECHNIQUE. THIN SOLID FILMS. 193:92-99.
  Full Text via DOI: 10.1016/S0040-6090(05)80016-1 Web of Science: A1990EQ38300014
- 1990
  
  STUDY OF THE IONIZED CLUSTER BEAM TECHNIQUE USING ENERGY-ANALYZED GOLD DEPOSITIONS. JOURNAL OF APPLIED PHYSICS. 67:7082-7085.
  Full Text via DOI: 10.1063/1.345057 Web of Science: A1990DE28900070
- 1988
  
  ELLIPSOMETER MEASUREMENT OF THICKNESS AND OPTICAL-PROPERTIES OF THIN ABSORBING FILMS. APPLIED SURFACE SCIENCE. 33-4:934-941.
  Full Text via DOI: 10.1016/0169-4332(88)90401-1 Web of Science: A1988Q431500122
- 1988
  
  OPTICAL-PROPERTIES OF REACTIVE ICB ALUMINUM-OXIDE FILMS DEPOSITED ON SI(100). APPLIED SURFACE SCIENCE. 33-4:966-971.
  Full Text via DOI: 10.1016/0169-4332(88)90405-9 Web of Science: A1988Q431500126
- 1982
  
  ChemInform Abstract: DIFFERENTIAL REFLECTOMETRY OF THIN FILM METAL OXIDES ON COPPER, TUNGSTEN, MOLYBDENUM, AND CHROMIUM
  Full Text via DOI: 10.1002/chin.198237022
- 1982
  
  DIFFERENTIAL REFLECTOMETRY OF THIN-FILM METAL-OXIDES ON COPPER, TUNGSTEN, MOLYBDENUM AND CHROMIUM
  Full Text via DOI: 10.1016/0010-938X(82)90045-2 Web of Science: A1982NX92300004
- Nanoparticle beam formation and investigation of gold nanostructured films. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. 21:2313-2318.
  Full Text via DOI: 10.1116/1.1615985 Web of Science: 000188193600007
- Optical properties of cobalt oxide films deposited by spray pyrolysis. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 14:685-692.
  Full Text via DOI: 10.1116/1.580372 Web of Science: A1996UR13400005
- STUDY OF THE IONIZED CLUSTER BEAM TECHNIQUE. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 8:1453-1457.
  Full Text via DOI: 10.1116/1.576856 Web of Science: A1990DG23600035
Book Chapter
- 1994
  
  COMPARATIVE STUDY OF THE SURFACE ROUGHNESS OF OXIDE THIN FILMS. 281-299.
  Web of Science: A1994BC72R00029
Conference
- 2017
  
  Use of numerical modeling analysis to obtain free cortisol secretion and elimination in patients with cirrhosis: Relationship to liver disease variables. HEPATOLOGY. 1034A-1034A.
  Web of Science: 000412089802306
- 2010
  
  Numerical ellipsometry: Analysis of thin metal layers using n-k-d twisted curve methods with multiple incidence angles. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 947-952.
  Full Text via DOI: 10.1116/1.3439679 Web of Science: 000280479700085
- 2009
  
  ASSESSMENT OF MAXIMAL CORTISOL SECRETION RATES IN SECONDARY ADRENAL INSUFFICIENCY (AI) PATIEINTS AND IN HEALTHY CONTROLS USING ADVANCED NUMERICAL MODELING METHODS. JOURNAL OF INVESTIGATIVE MEDICINE. 112-112.
  Web of Science: 000270092400062
- 2002
  
  Nanophase films deposited from a high-rate, nanoparticle beam. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. 995-999.
  Full Text via DOI: 10.1116/1.1481749 Web of Science: 000176358300040
- 1999
  
  Modeling of large cluster synthesis. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 2364-2367.
  Full Text via DOI: 10.1116/1.581774 Web of Science: 000081485800104
- 1999
  
  Nanophase copper thin films deposited from a beam source. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 2374-2377.
  Full Text via DOI: 10.1116/1.581915 Web of Science: 000081485800106
- 1997
  
  Determining the optical properties of a mixed-metal oxide film, Co3-x-yCrxFeyO4, with spectroscopic ellipsometry and atomic force microscopy. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 998-1006.
  Full Text via DOI: 10.1116/1.580794 Web of Science: A1997XE73100103
- 1996
  
  Analysis of surface void fraction using atomic force microscopy. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 1957-1962.
  Full Text via DOI: 10.1116/1.580367 Web of Science: A1996UR13300113
- 1994
  
  DEVELOPMENT OF ARTIFICIAL NEURAL NETWORKS FOR IN-SITU ELLIPSOMETRY OF FILMS GROWING ON UNKNOWN SUBSTRATES. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 1952-1956.
  Full Text via DOI: 10.1116/1.578988 Web of Science: A1994NZ03200029
- 1993
  
  STUDY OF ZINC THIN-FILMS FORMED USING LARGE CLUSTERS IN THE IONIZED CLUSTER BEAM DEPOSITION TECHNIQUE. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. 1916-1920.
  Full Text via DOI: 10.1116/1.586522 Web of Science: A1993MC57200027
- 1992
  
  EFFECTS OF SPACE-CHARGE ON ION ENERGY IN IONIZED CLUSTER BEAM FILM DEPOSITION. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 1488-1492.
  Full Text via DOI: 10.1116/1.578271 Web of Science: A1992JE68200016
- 1990
  
  CLUSTER SIZE IN IONIZED CLUSTER BEAM DEPOSITION. 8-18.
  Full Text via DOI: 10.1117/12.22368 Web of Science: A1990BS46M00002
- 1990
  
  DEVELOPMENTS IN INSITU ELLIPSOMETER MONITORING OF THIN-FILM GROWTH DURING REACTIVE ION PLATING DEPOSITION. 133-146.
  Full Text via DOI: 10.1117/12.20372 Web of Science: A1990BR80C00015
- 1990
  
  Practical approach to determining n, k, and d of a growing film with an in situ ellipsometer. thcc2.
  Full Text via DOI: 10.1364/oam.1990.thcc2
- VIRTUAL INTERFACE METHOD FOR IN-SITU ELLIPSOMETRY OF FILMS GROWN ON UNKNOWN SUBSTRATES. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 976-980.
  Full Text via DOI: 10.1116/1.578578 Web of Science: A1993LP00700044
Letter
- 2021
  
  Letter to the Editor: "Prevention of Adrenal Crisis: Cortisol Responses to Major Stress Compared to Stress Dose Hydrocortisone Delivery". JOURNAL OF CLINICAL ENDOCRINOLOGY & METABOLISM. E393-E394.
  Full Text via DOI: 10.1210/clinem/dgaa709 Web of Science: 000608480200041
- 2020
  
  Letter to the Editor: "Dynamic Pituitary-Adrenal Interactions in the Critically ill After Cardiac Surgery". JOURNAL OF CLINICAL ENDOCRINOLOGY & METABOLISM. E3482-E3483.
  Full Text via DOI: 10.1210/clinem/dgaa418 Web of Science: 000574866500043
Other Scholarly Work
- 1990
  
  PROCESS ANALYSIS OF THIN-FILM DEPOSITION WITH AN INSITU ELLIPSOMETER. 346-354.
  Web of Science: A1990BQ39M00034

full name

Frank Urban

ORCID iD

https://orcid.org/0000-0002-2014-9166 (confirmed)

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