Surface analysis algorithms for scanning probe microscopy Article

Lindquist, CS, Urban, FK. (1995). Surface analysis algorithms for scanning probe microscopy . THIN SOLID FILMS, 270(1-2), 399-405. 10.1016/0040-6090(95)06708-6

Open Access

keywords

  • Materials Science
  • Materials Science, Coatings & Films
  • Materials Science, Multidisciplinary
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • Science & Technology
  • Technology
  • atomic force microscopy
  • coatings
  • oxides
  • surface morphology

Location

  • SAN DIEGO, CA

Digital Object Identifier (DOI)

publisher

  • ELSEVIER SCIENCE SA LAUSANNE

start page

  • 399

end page

  • 405

volume

  • 270

issue

  • 1-2