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THIN SOLID FILMS
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Overview
publication venue for
Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic films
. 663:116-125.
2018
Comparison of three methods for ellipsometry characterization of thin absorbing films
. 644:182-189.
2017
Reactive sputter deposition and annealing of nanometer scale NiO thin films for metal-insulator-metal tunnel junction diodes
. 644:23-28.
2017
Formation of sol-gel based Cu
2
ZnSnS
4
thin films using ppm-level hydrogen sulfide
. 625:122-130.
2017
Numerical ellipsometry: Examination of growing nickel and rhenium thin films using n-k plane analysis and effective numerical substrates
. 583:239-244.
2015
Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane
. 562:49-55.
2014
Fluctuation-induced tunneling dominated electrical transport in multi-layered single-walled carbon nanotube films
. 519:7987-7991.
2011
Numerical ellipsometry: Advanced analysis of thin absorbing films in the n-k plane
. 519:6284-6289.
2011
Thermal stability analysis of thin film Ni-NiOx-Cr tunnel junctions
. 518:3367-3372.
2010
Nanoscratch behavior of carbon nanotube reinforced aluminum coatings
. 518:1703-1711.
2010
Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles
. 518:1411-1414.
2009
Metal oxide-chitosan based nanocomposite for cholesterol biosensor
. 518:614-620.
2009
Numerical Ellipsometry: Ellipsometer analysis in the n-k plane for growing films on unknown homogeneous, isotropic substrates and unknown, layered substrates
. 517:1081-1085.
2008
Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators
. 517:1063-1071.
2008
Effects of dielectric thickness and contact area on current-voltage characteristics of thin film metal-insulator-metal diodes
. 516:2244-2250.
2008
Ellipsometer analysis in the n-k plane
. 516:119-127.
2007
Ellipsometer measurements using focused and masked beams
. 515:911-916.
2006
Structural analysis of TiO2 films grown using microwave-activated chemical bath deposition
. 419:65-68.
2002
Optical properties of nanophase films measured by variable-angle spectroscopic ellipsometry
. 408:211-217.
2002
Damage study of ITO under high electric field
. 363:240-243.
2000
Interesting optical properties of films composed of very small grains formed from a high-rate nanoparticle beam
. 355:513-517.
1999
Extremely fast ellipsometry solutions using cascaded neural networks alone
. 332:50-55.
1998
Toward a priori selection of ellipsometry angles and wavelengths using a high performance semantic database
. 313:119-123.
1998
Sensitivity of variable angle spectroscopic ellipsometry to isotropic thin film properties
. 308:31-37.
1997
An algorithm for analyzing ellipsometric data taken with multiple angles of incidence
. 290:51-56.
1996
Comparison of atomic force microscope and Rutherford backscattering spectrometry data of nanometre size zinc islands
. 290:312-316.
1996
A novel technique for fabrication of metallic structures on polyimide by selective electroless copper plating using ion implantation
. 270:489-492.
1995
Numerical techniques useful in the practice of ellipsometry
. 270:78-84.
1995
Recent developments in ionized cluster beam thin film deposition
. 270:637-642.
1995
Surface analysis algorithms for scanning probe microscopy
. 270:399-405.
1995
ADVANCED IMAGE-PROCESSING IN SCANNING PROBE MICROSCOPY
. 253:318-325.
1994
GOLD AND ZINC THIN-FILMS DEPOSITED BY THE IONIZED CLUSTER BEAM TECHNIQUE
. 253:402-406.
1994
MODELING OF SURFACE-ROUGHNESS IN VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY, USING NUMERICAL PROCESSING OF ATOMIC-FORCE MICROSCOPY IMAGES
. 253:326-332.
1994
NUMERICAL ELLIPSOMETRY - ENHANCEMENT OF NEW ALGORITHMS FOR REAL-TIME, IN-SITU FILM GROWTH MONITORING
. 253:262-268.
1994
SELECTIVE ELECTROLESS COPPER PLATING ON SILICON SEEDED BY COPPER-ION IMPLANTATION
. 253:391-394.
1994
REAL-TIME, IN-SITU ELLIPSOMETRY SOLUTIONS USING ARTIFICIAL NEURAL-NETWORK PREPROCESSING
. 245:167-173.
1994
DEVELOPMENT OF ARTIFICIAL NEURAL NETWORKS FOR REAL-TIME, INSITU ELLIPSOMETRY DATA REDUCTION
. 220:247-253.
1992
FORMATION OF GOLD CLUSTERS IN THE IONIZED CLUSTER BEAM DEPOSITION TECHNIQUE
. 193:92-99.
1990
INTEGRATED METAL LANGMUIR SEMICONDUCTOR FIELD-EFFECT TRANSISTORS
. 180:217-225.
1989
FORCED DEPOSITION OF POLAR Z-TYPE LANGMUIR-BLODGETT FILMS
. 179:319-325.
1989
MOBILE ION DRIFT IN LANGMUIR-BLODGETT FILMS
. 179:313-317.
1989
Planar silicon field-effect transistors with Langmuir-Blodgett gate insulators
. 132:33-39.
1985
Langmuir-Blodgett films as barrier layers in Josephson tunnel junctions
. 99:277-282.
1983
Carbon nanotubes chitosan nanobiocomposite for immunosensor
2010
Sol-gel derived cerium-oxide-silicon-oxide nanocomposite for cypermethrin detection
2010
Research
category
MATERIALS SCIENCE, COATINGS & FILMS
Category
MATERIALS SCIENCE, MULTIDISCIPLINARY
Category
PHYSICS, APPLIED
Category
PHYSICS, CONDENSED MATTER
Category
Identifiers
International Standard Serial Number (ISSN)
0040-6090
Other
journal abbreviation
THIN SOLID FILMS