Comparison of atomic force microscope and Rutherford backscattering spectrometry data of nanometre size zinc islands Article

Tabet, MF, Urban, FK. (1996). Comparison of atomic force microscope and Rutherford backscattering spectrometry data of nanometre size zinc islands . Thin Solid Films, 290 312-316. 10.1016/S0040-6090(96)08968-7

keywords

  • BEAM FILM DEPOSITION
  • CLUSTERS
  • DECONVOLUTION
  • IMAGES
  • Materials Science
  • Materials Science, Coatings & Films
  • Materials Science, Multidisciplinary
  • PROBE MICROSCOPY
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • RES
  • SCANNING TUNNELING MICROSCOPY
  • Science & Technology
  • TIP RECONSTRUCTION
  • Technology
  • atomic force microscope
  • deconvolution
  • ionized cluster beam

Digital Object Identifier (DOI)

start page

  • 312

end page

  • 316

volume

  • 290