Numerical ellipsometry: Examination of growing nickel and rhenium thin films using n-k plane analysis and effective numerical substrates
Article
Urban, FK, Barton, D. (2015). Numerical ellipsometry: Examination of growing nickel and rhenium thin films using n-k plane analysis and effective numerical substrates
. THIN SOLID FILMS, 583 239-244. 10.1016/j.tsf.2015.03.062
Urban, FK, Barton, D. (2015). Numerical ellipsometry: Examination of growing nickel and rhenium thin films using n-k plane analysis and effective numerical substrates
. THIN SOLID FILMS, 583 239-244. 10.1016/j.tsf.2015.03.062