Numerical ellipsometry: Examination of growing nickel and rhenium thin films using n-k plane analysis and effective numerical substrates Article

Urban, FK, Barton, D. (2015). Numerical ellipsometry: Examination of growing nickel and rhenium thin films using n-k plane analysis and effective numerical substrates . THIN SOLID FILMS, 583 239-244. 10.1016/j.tsf.2015.03.062

keywords

  • ABSORBING FILMS
  • Ellipsometry
  • IN-SITU ELLIPSOMETRY
  • In-situ
  • MULTIPLE INCIDENCE ANGLES
  • Materials Science
  • Materials Science, Coatings & Films
  • Materials Science, Multidisciplinary
  • Nickel
  • Numerical
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • Rhenium
  • Science & Technology
  • Technology
  • Thin film
  • Virtual substrate

Digital Object Identifier (DOI)

publisher

  • ELSEVIER SCIENCE SA

start page

  • 239

end page

  • 244

volume

  • 583