Optical properties of nanophase films measured by variable-angle spectroscopic ellipsometry Article

Urban, FK, Hosseini-Tehrani, A, Khabari, A et al. (2002). Optical properties of nanophase films measured by variable-angle spectroscopic ellipsometry . THIN SOLID FILMS, 408(1-2), 211-217. 10.1016/S0040-6090(02)00082-2

Industry Collaboration

cited authors

  • Urban, FK; Hosseini-Tehrani, A; Khabari, A; Griffiths, P; Bungay, C; Petrov, I; Kim, Y

publication date

  • April 3, 2002

published in

keywords

  • ALLOY
  • COERCIVITY
  • MAGNETIC-PROPERTIES
  • Materials Science
  • Materials Science, Coatings & Films
  • Materials Science, Multidisciplinary
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • Science & Technology
  • Technology
  • ellipsometry
  • nanostructures
  • optical properties
  • tantalum

Digital Object Identifier (DOI)

publisher

  • ELSEVIER SCIENCE SA

start page

  • 211

end page

  • 217

volume

  • 408

issue

  • 1-2