Ellipsometer analysis in the n-k plane Article

Barton, D, Urban, FK. (2007). Ellipsometer analysis in the n-k plane . Thin Solid Films, 516(2-4), 119-127. 10.1016/j.tsf.2007.06.080

cited authors

  • Barton, D; Urban, FK

sustainable development goals

authors

publication date

  • December 3, 2007

published in

keywords

  • Materials Science
  • Materials Science, Coatings & Films
  • Materials Science, Multidisciplinary
  • NUMERICAL ELLIPSOMETRY
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • REAL-TIME
  • Science & Technology
  • Technology
  • ellipsometry
  • optical measurement
  • thin film

Digital Object Identifier (DOI)

start page

  • 119

end page

  • 127

volume

  • 516

issue

  • 2-4