Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic films Article

Urban, FK, Barton, D. (2018). Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic films . THIN SOLID FILMS, 663 116-125. 10.1016/j.tsf.2018.07.047

keywords

  • Anisotropic materials
  • Ellipsometry
  • MEDIA
  • Materials Science
  • Materials Science, Coatings & Films
  • Materials Science, Multidisciplinary
  • OPTICS
  • Optical measurements
  • Optical properties
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • Science & Technology
  • Technology
  • Thin films

Location

  • San Diego, CA

Digital Object Identifier (DOI)

publisher

  • ELSEVIER SCIENCE SA

start page

  • 116

end page

  • 125

volume

  • 663