Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic films
Article
Urban, FK, Barton, D. (2018). Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic films
. THIN SOLID FILMS, 663 116-125. 10.1016/j.tsf.2018.07.047
Urban, FK, Barton, D. (2018). Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic films
. THIN SOLID FILMS, 663 116-125. 10.1016/j.tsf.2018.07.047