Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane Article

Urban, FK, Barton, D. (2014). Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane . THIN SOLID FILMS, 562 49-55. 10.1016/j.tsf.2014.03.067

keywords

  • Chromium
  • Ellipsometry
  • MULTIPLE INCIDENCE ANGLES
  • Materials Science
  • Materials Science, Coatings & Films
  • Materials Science, Multidisciplinary
  • Numerical ellipsometry
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • Science & Technology
  • Technology
  • Thin film

Digital Object Identifier (DOI)

publisher

  • ELSEVIER SCIENCE SA

start page

  • 49

end page

  • 55

volume

  • 562