Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane
Article
Urban, FK, Barton, D. (2014). Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane
. THIN SOLID FILMS, 562 49-55. 10.1016/j.tsf.2014.03.067
Urban, FK, Barton, D. (2014). Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane
. THIN SOLID FILMS, 562 49-55. 10.1016/j.tsf.2014.03.067