Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators
Article
Urban, FK, Barton, D. (2008). Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators
. THIN SOLID FILMS, 517(3), 1063-1071. 10.1016/j.tsf.2008.05.041
Urban, FK, Barton, D. (2008). Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators
. THIN SOLID FILMS, 517(3), 1063-1071. 10.1016/j.tsf.2008.05.041