Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators Article

Urban, FK, Barton, D. (2008). Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators . THIN SOLID FILMS, 517(3), 1063-1071. 10.1016/j.tsf.2008.05.041

keywords

  • Ellipsometry
  • Growing films
  • Materials Science
  • Materials Science, Coatings & Films
  • Materials Science, Multidisciplinary
  • Optical measurements
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • REAL-TIME
  • Science & Technology
  • Technology
  • Thin films

Digital Object Identifier (DOI)

publisher

  • ELSEVIER SCIENCE SA

start page

  • 1063

end page

  • 1071

volume

  • 517

issue

  • 3