Numerical ellipsometry: Advanced analysis of thin absorbing films in the n-k plane Article

Urban, FK, Barton, D. (2011). Numerical ellipsometry: Advanced analysis of thin absorbing films in the n-k plane . THIN SOLID FILMS, 519(19), 6284-6289. 10.1016/j.tsf.2011.03.133

keywords

  • Absorbing films
  • Chromium
  • Ellipsometry
  • MULTIPLE INCIDENCE ANGLES
  • Materials Science
  • Materials Science, Coatings & Films
  • Materials Science, Multidisciplinary
  • Optical properties
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • Science & Technology
  • Technology

Digital Object Identifier (DOI)

publisher

  • ELSEVIER SCIENCE SA

start page

  • 6284

end page

  • 6289

volume

  • 519

issue

  • 19