Urban, FK, Barton, D, Tiwald, T. (2009). Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles
.
THIN SOLID FILMS, 518(5), 1411-1414. 10.1016/j.tsf.2009.09.071
Urban, FK, Barton, D, Tiwald, T. (2009). Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles
. THIN SOLID FILMS, 518(5), 1411-1414. 10.1016/j.tsf.2009.09.071