Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry Article

Athey, PR, Urban, FK, Holloway, PH. (1996). Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry . 14(6), 3436-3444.

keywords

  • Engineering
  • Engineering, Electrical & Electronic
  • Nanoscience & Nanotechnology
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Science & Technology - Other Topics
  • TIN OXIDE-FILMS
  • Technology

publisher

  • AMER INST PHYSICS

start page

  • 3436

end page

  • 3444

volume

  • 14

issue

  • 6