Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry
Article
Athey, PR, Urban, FK, Holloway, PH. (1996). Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry
. 14(6), 3436-3444.
Athey, PR, Urban, FK, Holloway, PH. (1996). Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry
. 14(6), 3436-3444.