Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry Article

Athey, PR, Urban, FK, Holloway, PH. (1996). Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry .(6), 3436-3444.

cited authors

  • Athey, PR; Urban, FK; Holloway, PH

authors

publication date

  • November 1, 1996

keywords

  • Engineering
  • Engineering, Electrical & Electronic
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Science & Technology - Other Topics
  • TIN OXIDE-FILMS
  • Technology

start page

  • 3436

end page

  • 3444

issue

  • 6