Urban, FK. (1988). Ellipsometer measurement of thickness and optical properties of thin absorbing films
.
APPLIED SURFACE SCIENCE, 33-34(C), 934-941. 10.1016/0169-4332(88)90401-1
Urban, FK. (1988). Ellipsometer measurement of thickness and optical properties of thin absorbing films
. APPLIED SURFACE SCIENCE, 33-34(C), 934-941. 10.1016/0169-4332(88)90401-1