Numerical ellipsometry: n-k plane analysis of transparent conducting films

Numerical ellipsometry: n-k plane analysis of transparent conducting films Article

Barton, D, Urban, FK. (2011). Numerical ellipsometry: n-k plane analysis of transparent conducting films . JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 29(4), 10.1116/1.3589803

cited authors

Barton, D; Urban, FK

sustainable development goals

SDG 03: Good Health and Well-being

authors

Urban, Frank

publication date

July 1, 2011

webpage

https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000292639500016&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=e451fd656366bf1ec5554941920a9ccb

published in

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A Journal

keywords

MULTIPLE INCIDENCE ANGLES
Materials Science
Materials Science, Coatings & Films
Physical Sciences
Physics
Physics, Applied
Science & Technology
Technology

FIU Discovery

Numerical ellipsometry: n-k plane analysis of transparent conducting films Article

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cited authors

sustainable development goals

authors

publication date

webpage

published in

Research

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Digital Object Identifier (DOI)

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