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Numerical ellipsometry:
n-k
plane analysis of transparent conducting films
Article
Barton, D, Urban, FK. (2011). Numerical ellipsometry:
n-k
plane analysis of transparent conducting films .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A,
29(4), 10.1116/1.3589803
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Barton, D, Urban, FK. (2011). Numerical ellipsometry:
n-k
plane analysis of transparent conducting films .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A,
29(4), 10.1116/1.3589803
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Overview
cited authors
Barton, D; Urban, FK
sustainable development goals
SDG 03: Good Health and Well-being
authors
Urban, Frank
publication date
July 1, 2011
published in
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
Journal
Research
keywords
MULTIPLE INCIDENCE ANGLES
Materials Science
Materials Science, Coatings & Films
Physical Sciences
Physics
Physics, Applied
Science & Technology
Technology
Identifiers
Digital Object Identifier (DOI)
https://doi.org/10.1116/1.3589803
Additional Document Info
publisher
A V S AMER INST PHYSICS
volume
29
issue
4