Numerical ellipsometry: n-k plane analysis of transparent conducting films Article

Barton, D, Urban, FK. (2011). Numerical ellipsometry: n-k plane analysis of transparent conducting films . JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 29(4), 10.1116/1.3589803

cited authors

  • Barton, D; Urban, FK

sustainable development goals

authors

publication date

  • July 1, 2011

keywords

  • MULTIPLE INCIDENCE ANGLES
  • Materials Science
  • Materials Science, Coatings & Films
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Technology

Digital Object Identifier (DOI)

publisher

  • A V S AMER INST PHYSICS

volume

  • 29

issue

  • 4