Deconvolution of tip affected atomic force microscope images and comparison to Rutherford backscattering spectrometry Article

Tabet, MF, Urban, FK. (1997). Deconvolution of tip affected atomic force microscope images and comparison to Rutherford backscattering spectrometry . 15(4), 800-804. 10.1116/1.589412

keywords

  • CLUSTER BEAM DEPOSITION
  • Engineering
  • Engineering, Electrical & Electronic
  • Nanoscience & Nanotechnology
  • PROBE MICROSCOPY
  • Physical Sciences
  • Physics
  • Physics, Applied
  • RECONSTRUCTION
  • SCANNING TUNNELING MICROSCOPY
  • Science & Technology
  • Science & Technology - Other Topics
  • THIN-FILMS
  • Technology

Location

  • PHILADELPHIA, PA

Digital Object Identifier (DOI)

publisher

  • AMER INST PHYSICS

start page

  • 800

end page

  • 804

volume

  • 15

issue

  • 4