Numerical ellipsometry: Methods for selecting measurements and techniques for advanced analysis applied to β-gallium oxide Article

Urban, Frank K, Barton, David, Schubert, Mathias. (2020). Numerical ellipsometry: Methods for selecting measurements and techniques for advanced analysis applied to β-gallium oxide . Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 38(2), 10.1116/1.5134790

cited authors

  • Urban, Frank K; Barton, David; Schubert, Mathias

sustainable development goals

authors

publication date

  • March 1, 2020

published in

keywords

  • MEDIA
  • Materials Science
  • Materials Science, Coatings & Films
  • OPTICS
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Technology

Digital Object Identifier (DOI)

volume

  • 38

issue

  • 2