Analysis of surface void fraction using atomic force microscopy Conference

Lindquist, CS, Urban, FK. (1996). Analysis of surface void fraction using atomic force microscopy . Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 14(3), 1957-1962. 10.1116/1.580367

keywords

  • Materials Science
  • Materials Science, Coatings & Films
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Technology

Digital Object Identifier (DOI)

start page

  • 1957

end page

  • 1962

volume

  • 14

issue

  • 3