Analysis of surface void fraction using atomic force microscopy Conference

Lindquist, CS, Urban, FK. (1996). Analysis of surface void fraction using atomic force microscopy . JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 14(3), 1957-1962. 10.1116/1.580367

keywords

  • Materials Science
  • Materials Science, Coatings & Films
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Technology

Location

  • MINNEAPOLIS, MN

Digital Object Identifier (DOI)

Conference

  • 42nd National Symposium of the American-Vacuum-Society

publisher

  • AMER INST PHYSICS

start page

  • 1957

end page

  • 1962

volume

  • 14

issue

  • 3