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Numerical ellipsometry: Real-time solutions using mapping onto the complex index plane
Article
Barton, D, Comfort, JC, Urban, FK. Numerical ellipsometry: Real-time solutions using mapping onto the complex index plane .
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films,
14(3), 786-790. 10.1116/1.580390
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Barton, D, Comfort, JC, Urban, FK. Numerical ellipsometry: Real-time solutions using mapping onto the complex index plane .
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films,
14(3), 786-790. 10.1116/1.580390
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Overview
cited authors
Barton, D; Comfort, JC; Urban, FK
sustainable development goals
SDG 03: Good Health and Well-being
authors
Urban, Frank
published in
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Journal
Research
keywords
FILMS
Materials Science
Materials Science, Coatings & Films
Physical Sciences
Physics
Physics, Applied
Science & Technology
Technology
Identifiers
Digital Object Identifier (DOI)
https://doi.org/10.1116/1.580390
Additional Document Info
start page
786
end page
790
volume
14
issue
3