TEM determination of the misfit stress in GaInAs/(001)GaAs epitaxial systems by specimen curvature analysis Conference

Rocher, A, Cabié, M, Ponchet, A et al. (2004). TEM determination of the misfit stress in GaInAs/(001)GaAs epitaxial systems by specimen curvature analysis . Design and Nature

cited authors

  • Rocher, A; Cabié, M; Ponchet, A; Carrère, H

authors

publication date

  • November 17, 2004

published in