Technical Digest - International Electron Devices Meeting

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Technical Digest - International Electron Devices Meeting Journal

publication venue for

2 MB Array-Level Demonstration of STT-MRAM Process and Performance Towards L4 Cache Applications 2019
MRAM as Embedded Non-Volatile Memory Solution for 22FFL FinFET Technology 2018
Quantum, power, and compound semiconductor devices - GaN technology, processes, reliability and circuit applications 2006
Recent advances in III-V nitride electronic devices 2004
High-gain GaInP/GaAs HBT monolithic transimpedance amplifier for high-speed optoelectronic receivers 1998
Transient and steady-state Monte-Carlo simulation of the effects of junction grading on carrier transport in InAlAs/InGaAs HBT's 1990
EFFECT OF CHANNEL STRAIN ON THE ELECTRICAL CHARACTERISTICS OF InGaAs/InAlAs HEMTs. 1987

International Standard Serial Number (ISSN)

0163-1918