Fast Multi-Modal Reuse: Co-Occurrence Pre-Trained Deep Learning Models Conference

Iyer, Vasanth, Aved, Alexander, Howlett, Todd B et al. (2019). Fast Multi-Modal Reuse: Co-Occurrence Pre-Trained Deep Learning Models . SMART BIOMEDICAL AND PHYSIOLOGICAL SENSOR TECHNOLOGY XI, 10996 10.1117/12.2519546

cited authors

  • Iyer, Vasanth; Aved, Alexander; Howlett, Todd B; Carlo, Jeffrey T; Mehmood, Asif; Pissinou, Niki; Iyengar, SS

authors

date/time interval

  • April 15, 2019 -

publication date

  • January 1, 2019

webpage

published in

keywords

  • Autoencoder
  • Jaccard Similarity
  • Minhashing
  • Optics
  • Physical Sciences
  • Science & Technology
  • Semantic Hashing
  • Sensor Selection

Location

  • Baltimore, MD

Digital Object Identifier (DOI)

Conference

  • Conference on Real-Time Image Processing and Deep Learning

publisher

  • SPIE-INT SOC OPTICAL ENGINEERING

volume

  • 10996