Florida International University
Edit Your Profile
FIU Discovery
Toggle navigation
Browse
Home
People
Organizations
Scholarly & Creative Works
Research Facilities
Support
Edit Your Profile
Fast Multi-Modal Reuse: Co-Occurrence Pre-Trained Deep Learning Models
Conference
Iyer, Vasanth, Aved, Alexander, Howlett, Todd B
et al
. (2019). Fast Multi-Modal Reuse: Co-Occurrence Pre-Trained Deep Learning Models .
SMART BIOMEDICAL AND PHYSIOLOGICAL SENSOR TECHNOLOGY XI,
10996 10.1117/12.2519546
Share this citation
Twitter
Email
Iyer, Vasanth, Aved, Alexander, Howlett, Todd B
et al
. (2019). Fast Multi-Modal Reuse: Co-Occurrence Pre-Trained Deep Learning Models .
SMART BIOMEDICAL AND PHYSIOLOGICAL SENSOR TECHNOLOGY XI,
10996 10.1117/12.2519546
Copy Citation
Share
Overview
Research
Location
Identifiers
Additional Document Info
View All
Overview
cited authors
Iyer, Vasanth; Aved, Alexander; Howlett, Todd B; Carlo, Jeffrey T; Mehmood, Asif; Pissinou, Niki; Iyengar, SS
authors
Iyengar, S.S.
Pissinou, Niki
date/time interval
April 15, 2019 -
publication date
January 1, 2019
webpage
https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000502040100006&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=e451fd656366bf1ec5554941920a9ccb
published in
ADVANCED BIOMEDICAL AND CLINICAL DIAGNOSTIC SYSTEMS VII
Book
Research
keywords
Autoencoder
Jaccard Similarity
Minhashing
Optics
Physical Sciences
Science & Technology
Semantic Hashing
Sensor Selection
Location
Location
Baltimore, MD
Identifiers
Digital Object Identifier (DOI)
https://doi.org/10.1117/12.2519546
Additional Document Info
Conference
Conference on Real-Time Image Processing and Deep Learning
publisher
SPIE-INT SOC OPTICAL ENGINEERING
volume
10996