Fast Multi-Modal Reuse: Co-Occurrence Pre-Trained Deep Learning Models Conference

Iyer, Vasanth, Aved, Alexander, Howlett, Todd B et al. (2019). Fast Multi-Modal Reuse: Co-Occurrence Pre-Trained Deep Learning Models . Proceedings of SPIE - The International Society for Optical Engineering, 10996 10.1117/12.2519546

cited authors

  • Iyer, Vasanth; Aved, Alexander; Howlett, Todd B; Carlo, Jeffrey T; Mehmood, Asif; Pissinou, Niki; Iyengar, SS

authors

date/time interval

  • April 15, 2019 -

publication date

  • January 1, 2019

published in

keywords

  • Autoencoder
  • Jaccard Similarity
  • Minhashing
  • Optics
  • Physical Sciences
  • Science & Technology
  • Semantic Hashing
  • Sensor Selection

Digital Object Identifier (DOI)

volume

  • 10996