Field Emission Properties of Top-Down GaN Nanowires Characterized in Vacuum by a Nanometer-Resolution Piezoelectric Probing System
Article
Doundoulakis, G, Pavlidis, D. (2024). Field Emission Properties of Top-Down GaN Nanowires Characterized in Vacuum by a Nanometer-Resolution Piezoelectric Probing System
. JOURNAL OF ELECTRONIC MATERIALS, 53(3), 1414-1424. 10.1007/s11664-023-10894-w
Doundoulakis, G, Pavlidis, D. (2024). Field Emission Properties of Top-Down GaN Nanowires Characterized in Vacuum by a Nanometer-Resolution Piezoelectric Probing System
. JOURNAL OF ELECTRONIC MATERIALS, 53(3), 1414-1424. 10.1007/s11664-023-10894-w