Field Emission Properties of Top-Down GaN Nanowires Characterized in Vacuum by a Nanometer-Resolution Piezoelectric Probing System Article

Doundoulakis, G, Pavlidis, D. (2024). Field Emission Properties of Top-Down GaN Nanowires Characterized in Vacuum by a Nanometer-Resolution Piezoelectric Probing System . JOURNAL OF ELECTRONIC MATERIALS, 53(3), 1414-1424. 10.1007/s11664-023-10894-w

cited authors

  • Doundoulakis, G; Pavlidis, D

authors

publication date

  • March 1, 2024

published in

keywords

  • Engineering
  • Engineering, Electrical & Electronic
  • Field emission
  • GaN
  • Materials Science
  • Materials Science, Multidisciplinary
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • TRANSISTOR
  • Technology
  • leveling
  • nanowires

Digital Object Identifier (DOI)

publisher

  • SPRINGER

start page

  • 1414

end page

  • 1424

volume

  • 53

issue

  • 3