Florida International University
Edit Your Profile
FIU Discovery
Toggle navigation
Browse
Home
People
Organizations
Scholarly & Creative Works
Research Facilities
Support
Applied Physics Express
Journal
Overview
Identifiers
View All
Overview
publication venue for
Effective suppression of interface states in recessed-gate MIS-HEMTs by TMAH wet etching
. 17.
2024
The effect of SiN
x
film for H plasma implantation in p-GaN/AlGaN/GaN high electron mobility transistors
. 15.
2022
Identifiers
International Standard Serial Number (ISSN)
1882-0778
Electronic International Standard Serial Number (EISSN)
1882-0786