Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

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Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Journal

publication venue for

Exploring Soft Errors (SEUs) with Digital Imager Pixels ranging from 7 to 1.3 μm 2017
CSST: Preventing Distribution of Unlicensed and Rejected ICs by Untrusted Foundry and Assembly 2014
Secure Split-Test for Preventing IC Piracy by Untrusted Foundry and Assembly 2013
Inter-plane via defect detection using the sensor plane in 3-D heterogeneous sensor systems 2005

International Standard Serial Number (ISSN)

1550-5774

International Standard Book Number (ISBN) 10

0-7695-2464-8