Exploring Soft Errors (SEUs) with Digital Imager Pixels ranging from 7 to 1.3 mu m Conference

Chapman, Glenn H, Purbakht, Parham, Le, Peter et al. (2017). Exploring Soft Errors (SEUs) with Digital Imager Pixels ranging from 7 to 1.3 mu m . 139-142.

International Collaboration

cited authors

  • Chapman, Glenn H; Purbakht, Parham; Le, Peter; Koren, Israel; Koren, Zahava

authors

date/time interval

  • October 23, 2017 -

publication date

  • January 1, 2017

webpage

keywords

  • APS
  • Computer Science
  • Computer Science, Hardware & Architecture
  • Engineering
  • Engineering, Electrical & Electronic
  • ISO
  • Nanoscience & Nanotechnology
  • SEU
  • Science & Technology
  • Science & Technology - Other Topics
  • Technology
  • hot pixel
  • imager defects

Location

  • Cambridge, ENGLAND

Conference

  • IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

publisher

  • IEEE

start page

  • 139

end page

  • 142