Simultaneously mapping topography, surface electrical, and mechanical properties by scanning ion conductance microscopy.
Article
Tabares, Jonathan, Prajapati, Navin J, Chandler, Kevin Brown et al. (2026). Simultaneously mapping topography, surface electrical, and mechanical properties by scanning ion conductance microscopy.
. REVIEW OF SCIENTIFIC INSTRUMENTS, 97(7), 073701. 10.1063/5.0301582
Tabares, Jonathan, Prajapati, Navin J, Chandler, Kevin Brown et al. (2026). Simultaneously mapping topography, surface electrical, and mechanical properties by scanning ion conductance microscopy.
. REVIEW OF SCIENTIFIC INSTRUMENTS, 97(7), 073701. 10.1063/5.0301582
Multi-parameter single-cell analysis and imaging are crucial for understanding fundamental cellular behavior and properties. Scanning ion conductance microscopy (SICM) is a powerful scanning probe microscope technique for studying the physical characteristics of individual cells under physiological conditions using a glass nanopipette as the scanning probe. Previously, SICM has been successfully developed for topography imaging, surface charge/potential mapping, and stiffness mapping of adherent cells. In this report, we demonstrated the integration of these three imaging modes to acquire three types of images simultaneously after optimizing the imaging conditions and data processing. Therefore, the morphology, electrical, and mechanical properties of cell surfaces can be investigated with a submicrometer spatial resolution. We successfully validated the method using various fixed and live cells, including HEK, CAL 27, and MoVas cells.
