Simultaneously mapping topography, surface electrical, and mechanical properties by scanning ion conductance microscopy Article

Tabares, Jonathan, Prajapati, Navin J, Chandler, Kevin Brown et al. (2026). Simultaneously mapping topography, surface electrical, and mechanical properties by scanning ion conductance microscopy . REVIEW OF SCIENTIFIC INSTRUMENTS, 97(7), 10.1063/5.0301582

cited authors

  • Tabares, Jonathan; Prajapati, Navin J; Chandler, Kevin Brown; Shaver, Mohammad; Wang, Zhe; Hutcheson, Joshua; He, Jin

authors

publication date

  • July 1, 2026

published in

keywords

  • ATOMIC-FORCE MICROSCOPY
  • Instruments & Instrumentation
  • LIVING CELLS
  • MODE
  • Physical Sciences
  • Physics
  • Physics, Applied
  • SINGLE-CELL ANALYSIS
  • Science & Technology
  • TENSION
  • Technology

Digital Object Identifier (DOI)

publisher

  • AIP Publishing

volume

  • 97

issue

  • 7