Non-Linear Output-Conductance Function for Robust Analysis of Two-Dimensional Transistors Article

Li, Guoli, Fan, Zizheng, Andre, Nicolas et al. (2021). Non-Linear Output-Conductance Function for Robust Analysis of Two-Dimensional Transistors . IEEE ELECTRON DEVICE LETTERS, 42(1), 94-97. 10.1109/LED.2020.3042212

Open Access International Collaboration

cited authors

  • Li, Guoli; Fan, Zizheng; Andre, Nicolas; Xu, Yongye; Xia, Ying; Iniguez, Benjamin; Liao, Lei; Flandre, Denis

authors

publication date

  • January 1, 2021

published in

keywords

  • Contact resistance
  • Engineering
  • Engineering, Electrical & Electronic
  • Integrated circuit reliability
  • Mathematical model
  • Resistance
  • Schottky barriers
  • Schottky contact
  • Science & Technology
  • Technology
  • Transistors
  • Two dimensional displays
  • Two-dimensional (2D) transistor
  • carrier mobility
  • contact resistance
  • low temperature
  • output conductance

Digital Object Identifier (DOI)

publisher

  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

start page

  • 94

end page

  • 97

volume

  • 42

issue

  • 1