In-situ recovery of on-membrane PD-SOI MOSFET from TID defects after gamma irradiation Conference

Sedki, Amor, Kilchytska, Valeriya, Tounsi, Fares et al. (2021). In-situ recovery of on-membrane PD-SOI MOSFET from TID defects after gamma irradiation . 2021 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS), 10.1109/EuroSOI-ULIS53016.2021.9560673

Open Access International Collaboration

cited authors

  • Sedki, Amor; Kilchytska, Valeriya; Tounsi, Fares; Andre, Nicolas; Francis, Laurent A; Flandre, Denis

authors

date/time interval

  • September 1, 2021 -

publication date

  • January 1, 2021

published in

keywords

  • Engineering
  • Engineering, Electrical & Electronic
  • Flicker noise
  • Gamma irradiation
  • In-Situ Thermal Annealing
  • MOSFET
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • Silicon On Insulator (SOI)
  • Technology
  • Total Ionizing Dose (TID)