2021 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS)

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2021 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS) Journal

publication venue for

In-situ recovery of on-membrane PD-SOI MOSFET from TID defects after gamma irradiation 2021
Operation of Suspended Lateral SOI PIN Photodiode with Aluminum Back Gate 2016

International Standard Serial Number (ISSN)

2330-5738

Electronic International Standard Serial Number (EISSN)

2472-9132