Radiation Degradation and Mitigation of an Ultrathin SOI SPAD Using a Perimeter Gate Article

Klauner, Tom, Roisin, Nicolas, Bonfanti, Ottilie et al. Radiation Degradation and Mitigation of an Ultrathin SOI SPAD Using a Perimeter Gate . IEEE TRANSACTIONS ON ELECTRON DEVICES, 1844-1850.

cited authors

  • Klauner, Tom; Roisin, Nicolas; Bonfanti, Ottilie; Alirezaei, Iman Sabri; Andre, Nicolas; Flandre, Denis

published in

keywords

  • Electric breakdown
  • Engineering, Electrical & Electronic
  • Physical Sciences
  • Physics
  • Semiconductor device measurement
  • Silicon-on-insulator
  • Single-photon avalanche diodes
  • TCAD
  • Technology
  • dark count rate (DCR)
  • rad-hard

publisher

  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

start page

  • 1844

end page

  • 1850