Trap studies in GaInP/GaAs and AlGaAs/GaAs HEMT's by means of low-frequency noise and transconductance dispersion characterizations
Article
Chan, Yi-Jen, Pavlidis, D. (1994). Trap studies in GaInP/GaAs and AlGaAs/GaAs HEMT's by means of low-frequency noise and transconductance dispersion characterizations
. IEEE TRANSACTIONS ON ELECTRON DEVICES, 41(5), 637-642. 10.1109/16.285009
Chan, Yi-Jen, Pavlidis, D. (1994). Trap studies in GaInP/GaAs and AlGaAs/GaAs HEMT's by means of low-frequency noise and transconductance dispersion characterizations
. IEEE TRANSACTIONS ON ELECTRON DEVICES, 41(5), 637-642. 10.1109/16.285009