Study of grown-in defects and effect of thermal annealing in Al0.3Ga0.7As and GaAs LPE layers
Article
Li, Sheng S, Lin, CY, Bedair, SM et al. (1982). Study of grown-in defects and effect of thermal annealing in Al0.3Ga0.7As and GaAs LPE layers
. JOURNAL OF ELECTRONIC MATERIALS, 11(2), 273-287. 10.1007/bf02654672
Li, Sheng S, Lin, CY, Bedair, SM et al. (1982). Study of grown-in defects and effect of thermal annealing in Al0.3Ga0.7As and GaAs LPE layers
. JOURNAL OF ELECTRONIC MATERIALS, 11(2), 273-287. 10.1007/bf02654672