Oxide composition studies of electrochemically grown tantalum oxide on sintered tantalum using XPS depth-profiling and co-relation with leakage properties Article

Chakraborti, Parthasarathi, Sharma, Himani, Pulugurtha, Markondeya Raj et al. (2017). Oxide composition studies of electrochemically grown tantalum oxide on sintered tantalum using XPS depth-profiling and co-relation with leakage properties . JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 28(24), 18773-18780. 10.1007/s10854-017-7826-1

Industry Collaboration

cited authors

  • Chakraborti, Parthasarathi; Sharma, Himani; Pulugurtha, Markondeya Raj; Gandhi, Saumya; Tummala, Rao R

authors

publication date

  • December 1, 2017

published in

keywords

  • CATHODIC ARC DEPOSITION
  • CORROSION PROTECTION
  • CURRENTS
  • Engineering
  • Engineering, Electrical & Electronic
  • FILMS
  • Materials Science
  • Materials Science, Multidisciplinary
  • NIOBIUM
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Physics, Condensed Matter
  • RAY PHOTOELECTRON-SPECTROSCOPY
  • SURFACE
  • Science & Technology
  • TA2O5
  • Technology
  • ULTRATHIN

Digital Object Identifier (DOI)

publisher

  • SPRINGER

start page

  • 18773

end page

  • 18780

volume

  • 28

issue

  • 24