Accelerated Metastable Solid–liquid Interdiffusion Bonding with High Thermal Stability and Power Handling
Article
Huang, TC, Smet, V, Kawamoto, S et al. (2018). Accelerated Metastable Solid–liquid Interdiffusion Bonding with High Thermal Stability and Power Handling
. JOURNAL OF ELECTRONIC MATERIALS, 47(1), 368-377. 10.1007/s11664-017-5779-z
Huang, TC, Smet, V, Kawamoto, S et al. (2018). Accelerated Metastable Solid–liquid Interdiffusion Bonding with High Thermal Stability and Power Handling
. JOURNAL OF ELECTRONIC MATERIALS, 47(1), 368-377. 10.1007/s11664-017-5779-z
Emerging high-performance systems are driving the need for advanced packaging solutions such as 3-D integrated circuits (ICs) and 2.5-D system integration with increasing performance and reliability requirements for off-chip interconnections. Solid–liquid interdiffusion (SLID) bonding resulting in all-intermetallic joints has been proposed to extend the applicability of solders, but faces fundamental and manufacturing challenges hindering its wide adoption. This paper introduces a Cu-Sn SLID interconnection technology, aiming at stabilization of the microstructure in the Cu6Sn5 metastable phase rather than the usual stable Cu3Sn phase. This enables formation of a void-free interface yielding higher mechanical strength than standard SLID bonding, as well as significantly reducing the transition time. The metastable SLID technology retains the benefits of standard SLID with superior I/O pitch scalability, thermal stability and current handling capability, while advancing assembly manufacturability. In the proposed concept, the interfacial reaction is controlled by introducing Ni(P) diffusion barrier layers, designed to effectively isolate the metastable Cu6Sn5 phase preventing any further transformation. Theoretical diffusion and kinetic models were applied to design the Ni–Cu–Sn interconnection stack to achieve the targeted joint composition. A daisy chain test vehicle was used to demonstrate this technology as a first proof of concept. Full transition to Cu6Sn5 was successfully achieved within a minute at 260°C as confirmed by scanning electron microscope (SEM) and x-ray energy dispersive spectroscopy (XEDS) analysis. The joint composition was stable through 10× reflow, with outstanding bond strength averaging 90 MPa. The metastable SLID interconnections also showed excellent electromigration performance, surviving 500 h of current stressing at 105 A/cm2 at 150°C.
