EMI/EMC Measurements and Simulations for Cables and PCBs Enclosed Within Metallic Structures Article

Khan, Zulfiqar A, Bayram, Yakup, Volakis, John L. (2008). EMI/EMC Measurements and Simulations for Cables and PCBs Enclosed Within Metallic Structures . IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 50(2), 441-445. 10.1109/TEMC.2008.921030

Industry Collaboration

cited authors

  • Khan, Zulfiqar A; Bayram, Yakup; Volakis, John L

sustainable development goals

authors

publication date

  • May 1, 2008

published in

keywords

  • Electromagnetic compatibility (EMC)
  • Engineering
  • Engineering, Electrical & Electronic
  • S-parameters
  • Science & Technology
  • Technology
  • Telecommunications
  • electromagnetic interference (EMI)
  • measurements

Digital Object Identifier (DOI)

publisher

  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

start page

  • 441

end page

  • 445

volume

  • 50

issue

  • 2