Florida International University
Edit Your Profile
FIU Discovery
Toggle navigation
Browse
Home
People
Organizations
Scholarly & Creative Works
Research Facilities
Support
Rapid In-Line Identification of Defects in Electronics Manufacturing
Grant
Rapid In-Line Identification of Defects in Electronics Manufacturing .
Share this citation
Twitter
Email
Rapid In-Line Identification of Defects in Electronics Manufacturing .
Copy Citation
Share
Overview
Affiliation
View All
Overview
date/time interval
September 15, 2026 - August 31, 2029
awarded by
National Science Foundation
administered by
Electrical and Computer Engineering
sponsor award ID
2622748
local award ID
AWD000000020035
Affiliation
contributor
Pulugurtha, Markondeyaraj
Co-Principal Investigator
Volakis, John
Co-Principal Investigator
Zekios, Constantinos
Principal Investigator