Florida International University
Edit Your Profile
FIU Discovery
Toggle navigation
Browse
Home
People
Organizations
Scholarly & Creative Works
Research Facilities
Support
Neural Processing Letters
Journal
Overview
Identifiers
View All
Overview
publication venue for
PATCHOUT: Adversarial Patch Detection and Localization using Semantic Consistency
. 57.
2025
Identifiers
International Standard Serial Number (ISSN)
1370-4621
Electronic International Standard Serial Number (EISSN)
1573-773X