PATCHOUT: Adversarial Patch Detection and Localization using Semantic Consistency Article

Simon, Dominic, Jha, Sumit, Ewetz, Rickard. (2025). PATCHOUT: Adversarial Patch Detection and Localization using Semantic Consistency . Neural Processing Letters, 57(3), 10.1007/s11063-025-11775-5

Open Access

cited authors

  • Simon, Dominic; Jha, Sumit; Ewetz, Rickard

sustainable development goals

authors

publication date

  • June 1, 2025

published in

keywords

  • Adversarial Machine Learning
  • Adversarial Patch
  • Artificial Intelligence
  • Computer Science
  • Computer Science, Artificial Intelligence
  • Computer Vision
  • Science & Technology
  • Technology

Digital Object Identifier (DOI)

volume

  • 57

issue

  • 3