Fluctuation and Noise Letters

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Fluctuation and Noise Letters Journal

publication venue for

Generation-recombination and 1/f noise in Al_0.4Ga_0.6N thin films. 2:L349-L355. 2002
Low-frequency noise in AlGaN/GaN heterostructure field effect transistors and metal oxide semiconductor reterostructure field effect transistors. 1:L221-L226. 2001

International Standard Serial Number (ISSN)

0219-4775