A Holistic Tri-region MLC STT-RAM Design with Combined Performance, Energy, and Reliability Optimizations Conference

Wen, Wujie, Mao, Mengjie, Li, Hai et al. (2016). A Holistic Tri-region MLC STT-RAM Design with Combined Performance, Energy, and Reliability Optimizations . 1285-1290.

International Collaboration

cited authors

  • Wen, Wujie; Mao, Mengjie; Li, Hai; Chen, Yiran; Pei, Yukui; Ge, Ning

authors

date/time interval

  • March 14, 2016 -

publication date

  • January 1, 2016

webpage

keywords

  • Automation & Control Systems
  • CACHE
  • Engineering
  • Engineering, Electrical & Electronic
  • Science & Technology
  • Technology

Location

  • Dresden, GERMANY

Conference

  • Design, Automation and Test in Europe Conference and Exhibition (DATE)

publisher

  • IEEE

start page

  • 1285

end page

  • 1290