A Low-Power and In Situ Annealing Technique for the Recovery of Active Devices After Proton Irradiation Conference

Francis, Laurent A, Sedki, Amor, Andre, Nicolas et al. (2018). A Low-Power and In Situ Annealing Technique for the Recovery of Active Devices After Proton Irradiation . MESON 2012 - 12TH INTERNATIONAL WORKSHOP ON PRODUCTION, PROPERTIES AND INTERACTION OF MESONS, 170 10.1051/epjconf/201817001006

Open Access International Collaboration

cited authors

  • Francis, Laurent A; Sedki, Amor; Andre, Nicolas; Kilchytska, Valeria; Gerard, Pierre; Ali, Zeeshan; Udrea, Florin; Flandre, Denis

authors

date/time interval

  • June 19, 2017 -

publication date

  • January 1, 2018

published in

keywords

  • Field Effect Transistors (FETs)
  • In situ annealing
  • Instruments & Instrumentation
  • Micro-hotplates
  • Nuclear Science & Technology
  • Proton radiation
  • Radiation mitigation
  • Science & Technology
  • Technology

Location

  • BELGIUM, Liege

Digital Object Identifier (DOI)

Conference

  • Conference on Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA)

publisher

  • E D P SCIENCES

volume

  • 170