Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle Conference

Delhaye, Thibault P, Roisin, Nicolas, Andre, Nicolas et al. (2021). Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle . 10.1109/SENSORS47087.2021.9639730

Open Access

cited authors

  • Delhaye, Thibault P; Roisin, Nicolas; Andre, Nicolas; Francis, Laurent A; Flandre, Denis

authors

date/time interval

  • October 31, 2021 -

publication date

  • January 1, 2021

keywords

  • Engineering
  • Engineering, Electrical & Electronic
  • Limit of detection
  • MOSFET
  • Remote Sensing
  • Science & Technology
  • Technology
  • lock-in
  • piezoresistive effect
  • sensor
  • strain

Location

  • ELECTR NETWORK

Digital Object Identifier (DOI)

Conference

  • 20th IEEE Sensors Conference

publisher

  • IEEE