Formation of thin tungsten oxide layers: Characterization and exposure to deuterium
Proceedings Paper
Addab, Y, Martin, C, Pardanaud, C et al. (2016). Formation of thin tungsten oxide layers: Characterization and exposure to deuterium
. 2016(T167), 10.1088/0031-8949/T167/1/014036
Addab, Y, Martin, C, Pardanaud, C et al. (2016). Formation of thin tungsten oxide layers: Characterization and exposure to deuterium
. 2016(T167), 10.1088/0031-8949/T167/1/014036
Thin tungsten oxide layers with thicknesses up to 250 nm have been formed on W surfaces by thermal oxidation following a parabolic growth rate. The reflectance of the layers in the IR range 2.5-16 μm has been measured showing a decrease with the layer thickness especially at low wavelengths. Raman microscopy and x-ray diffraction show a nanocrystalline WO3 monoclinic structure. Low energy deuterium plasma exposure (11 eV/D+) has been performed inducing a phase transition, a change in the sample colour and the formation of tungsten bronze (DxWO3). Implantation modifies the whole layer suggesting a deep diffusion of deuterium inside the oxide. After exposure, a deuterium release due to the oxidation of DxWO3 under ambient conditions has been evidenced showing a reversible deuterium retention.
