A Noise Immune Physics Informed Data-Driven Digital Twin for Inverter Component Degradation Estimation Article

Roy, Sukanta, Sarwat, Arif. (2025). A Noise Immune Physics Informed Data-Driven Digital Twin for Inverter Component Degradation Estimation . IEEE Access, 13 167165-167177. 10.1109/ACCESS.2025.3612737

Open Access

cited authors

  • Roy, Sukanta; Sarwat, Arif

authors

publication date

  • January 1, 2025

published in

keywords

  • CONVERTER
  • Capacitors
  • Computer Science
  • Computer Science, Information Systems
  • Degradation
  • Digital twins
  • ESR ESTIMATION METHOD
  • Engineering
  • Engineering, Electrical & Electronic
  • Inductors
  • Integrated circuit modeling
  • Inverter
  • Mathematical models
  • Noise
  • Noise measurement
  • OUTPUT CAPACITOR
  • RELIABILITY-ANALYSIS
  • Reliability
  • Science & Technology
  • Technology
  • Telecommunications
  • digital twin
  • filter degradation
  • parasitic resistance
  • particle swarm optimization
  • physics informed machine learning
  • random forest

Digital Object Identifier (DOI)

start page

  • 167165

end page

  • 167177

volume

  • 13