Data-Driven Digital Twin for Reliability Assessment of DC/DC Buck Converter Article

Roy, Sukanta, Behnamfar, Milad, Debnath, Anjan et al. (2025). Data-Driven Digital Twin for Reliability Assessment of DC/DC Buck Converter . IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, 13(3), 2712-2724. 10.1109/JESTPE.2024.3497772

Open Access

cited authors

  • Roy, Sukanta; Behnamfar, Milad; Debnath, Anjan; Sarwat, Arif

authors

publication date

  • June 1, 2025

published in

keywords

  • Buck converters
  • DC/DC buck converter
  • Degradation
  • Digital twins
  • Engineering
  • Engineering, Electrical & Electronic
  • Integrated circuit modeling
  • Load modeling
  • Particle swarm optimization
  • Science & Technology
  • Semiconductor device modeling
  • System performance
  • Technology
  • Testing
  • Training
  • digital twin (DT)
  • machine learning (ML)
  • parasitic resistance
  • particle swarm optimization (PSO)
  • reliability

Digital Object Identifier (DOI)

publisher

  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

start page

  • 2712

end page

  • 2724

volume

  • 13

issue

  • 3