Growth of high-quality SrTiO3 films using a hybrid molecular beam epitaxy approach Article

Jalan, Bharat, Engel-Herbert, Roman, Wright, Nicholas J et al. (2009). Growth of high-quality SrTiO3 films using a hybrid molecular beam epitaxy approach . JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 27(3), 461-464. 10.1116/1.3106610

cited authors

  • Jalan, Bharat; Engel-Herbert, Roman; Wright, Nicholas J; Stemmer, Susanne

sustainable development goals

authors

publication date

  • May 1, 2009

published in

keywords

  • BY-LAYER GROWTH
  • ENERGY ELECTRON-DIFFRACTION
  • INTENSITY OSCILLATIONS
  • Materials Science
  • Materials Science, Coatings & Films
  • OXIDES
  • Physical Sciences
  • Physics
  • Physics, Applied
  • SILICON
  • SURFACE-STRUCTURES
  • Science & Technology
  • THIN-FILMS
  • TIO2
  • Technology
  • X-ray diffraction
  • aluminium compounds
  • electron diffraction
  • insulating thin films
  • lanthanum compounds
  • molecular beam epitaxial growth
  • stoichiometry
  • strontium compounds
  • surface reconstruction
  • surface roughness

Digital Object Identifier (DOI)

publisher

  • A V S AMER INST PHYSICS

start page

  • 461

end page

  • 464

volume

  • 27

issue

  • 3