Effect of Surface Field on Breakdown for CMOS Single Photon Avalanche Diodes Conference

Hasan, Sajid, Nizam, Andalib, McFarlane, Nicole et al. (2023). Effect of Surface Field on Breakdown for CMOS Single Photon Avalanche Diodes . 736-743. 10.1109/SoutheastCon51012.2023.10115115

cited authors

  • Hasan, Sajid; Nizam, Andalib; McFarlane, Nicole; Shawkat, Mst Shamim Ara

authors

date/time interval

  • April 1, 2023 -

publication date

  • January 1, 2023

keywords

  • Computer Science
  • Computer Science, Artificial Intelligence
  • Computer Science, Interdisciplinary Applications
  • Device Simulation
  • MOBILITY
  • MODEL
  • PHOTODIODES
  • SILICON
  • SIMULATION
  • Science & Technology
  • TCAD simulation
  • Technology
  • avalanche photodiode
  • device modeling
  • single photon avalanche diode (SPAD)

Location

  • FL, Orlando

Conference

  • IEEE SoutheastCon Conference

publisher

  • IEEE

start page

  • 736

end page

  • 743