THz Response Based Hardware Security and Reliability Testing Powered by Deep Learning Image Classification Conference

Akter, Naznin, Siddiquee, Masudur R, Suarez, John et al. (2022). THz Response Based Hardware Security and Reliability Testing Powered by Deep Learning Image Classification . Proceedings of SPIE - The International Society for Optical Engineering, 12091 10.1117/12.2626871

cited authors

  • Akter, Naznin; Siddiquee, Masudur R; Suarez, John; Shur, Michael; Pala, Nezih

sustainable development goals

authors

date/time interval

  • April 3, 2022 -

publication date

  • January 1, 2022

published in

keywords

  • COUNTERFEIT INTEGRATED-CIRCUITS
  • DEVICE
  • Engineering
  • Engineering, Electrical & Electronic
  • Hardware security
  • INSPECTION
  • Imaging Science & Photographic Technology
  • Optics
  • Physical Sciences
  • Science & Technology
  • TECHNOLOGY
  • THz response
  • Technology
  • VLSI
  • convolutional neural networks
  • data augmentation
  • failure detection
  • integrated circuits
  • transfer learning

Digital Object Identifier (DOI)

International Standard Book Number (ISBN) 13

volume

  • 12091