Deep Level Characterization of LP-MOCVD Grown Al0.48In0.52As Article

Ducroquet, F, Guillot, G, Hong, K et al. (1993). Deep Level Characterization of LP-MOCVD Grown Al0.48In0.52As . 325 235. 10.1557/proc-325-235

cited authors

  • Ducroquet, F; Guillot, G; Hong, K; Hong, CH; Pavlidis, D; Gauneau, M

authors

publication date

  • January 1, 1993

keywords

  • 40 Engineering
  • 4016 Materials Engineering
  • 4018 Nanotechnology

Digital Object Identifier (DOI)

publisher

  • Springer Nature

start page

  • 235

volume

  • 325